NEXUSTEST is a global supplier providing high-end instruments and equipment for optical and semiconductor testing. We design and manufacture a wide range of products to test high speed optical modules, laser diodes, Silicon Photonics wafers, Co-Packaged Optics devices and so on, with the product portfolio including BERT (Bit Error Ratio Tester), DCA (Sampling Oscilloscope), SMU, ATE for optical modules, CoC Burn-In, Die Test system, SiPh Wafer Test system. In addition, our cutting-edge test systems cover the reliability and production test for both Si and SiC wafers or singulated dies, with the product portfolio including WAT (Wafer Acceptance Test), SiC/GaN WLBI (Wafer Level Burn-In), SiC KGD (Known-Good-Die) Handler, WLR (Wafer Level Reliability) and PLR (Package Level Reliability).